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Name: David Barton, Professor
Office Info: ECS 388, 305-348-2032
E-mail: bartoncis.fiu.edu
Homepage: http://www.cis.fiu.edu/~barton/
Office Hours: T/R 3:30-5:00 PM

Research and Instructional Interests
  • Structured Computer Organization
  • Unix Systems
Background Education
1966 - Ph.D., University of Cambridge, UK.
1963 - B.S., University of London


Professional Experience
1986 - present
  Professor, School of Computer Science, Florida International University, Miami, FL 33199
1980 - 1986
  Associate Professor, School of Computer Science, Florida International University, Miami, FL 33199
1976 - 1980
  Associate Professor, University of Missouri, St. Louis
1969 - 1974
  Assistant Director of Research, Computer Laboratory, University of Cambridge, UK
1968 - 1969
  Member of the Graduate Staff, Institute of Theoretical Astronomy, University of Cambridge, UK
1966 - 1968
  Technical Officer, Computer Laboratory, University of Cambridge, UK


Selected Publications
(or see the Full Listings)
  1. "Numerical Ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles" F. K. Urban III, D. Barton, T. Tiwald Thin Solid Films, (submitted) (2009)

  2. "Ellipsometer analysis in the n,k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates" F. K. Urban III, and D. Barton Thin Solid Films, V 517, P 1081-1085 (2008)

  3. "Ellipsometer Analysis in the n-k Plane for Select Combinations of Metals, Semiconductors, and Insulators" F. K. Urban III, and D. Barton Thin Solid Films, V 517, P 1063-1071 (2008)

  4. "Ellipsometer analysis in the n,k plane", D. Barton and F.K. Urban III, Thin Solid Films, V 516, P 119-127 (2007)

  5. "Ellipsometer measurements using focused and masked beams", D. Barton and F. K. Urban III, Thin Solid Films, V 515, P 911-916 (2006)

  6. "Toward a priori selection of ellipsometry angles and wavelengths using a high performance semantic database", F. K. Urban III, and David Barton, Thin Solid Films, 313/314, p 119 (1998)

  7. "Extremely fast ellipsometry solutions using cascaded neural networks alone", F. K. Urban III, D. Barton, and N. I. Boudani, Thin Solid Films, 332, p 50 (1998)